ABSTRACT
In Chapter 2, we began with the notion that the information on reliability in an accelerated test for devices meant to have ultrahigh reliability is in the failure-and degradation-free periods prior to any observable degradation or failure. To extract this information, we developed the notion of demarcation mapping. However, the analytical demarcation maps restrict consideration to single-step processes, while computational demarcation maps restrict consideration to just a single chosen alternative process.
