ABSTRACT
X-ray fluorescence (XRF) spectroscopy is a powerful technique for elemental analysis. All elements with atomic numbers 12 (Mg) and higher can be measured by most commercially available XRF units; many instruments can measure from atomic number 9 (F) and up. In general, the technique is fast, non-destructive, permits multi-element measurement, and is very sensitive. While XRF is most commonly used for multi-elemental, non-destructive analyses of solid and liquid samples, single element determinations, for example sulfur, can be run with speed, sensitivity, and minimum sample preparation. Sulfur determination by XRF in particulate matter collected on filters, a routine procedure in many laboratories, requires only 1 to 3 min per sample and little or no sample preparation.
