ABSTRACT
The need to test custom microelectronic circuits has been noted previously, but due to its significance the details have been left until now in order to consider the whole subject area within one chapter. As has been seen, for example, in Figure 5.3, aspects of testing may be involved in the CAD resources used during the design phase of a custom IC, but in all cases these requirements must always be considered as early as possible in the design of any new circuit.
