ABSTRACT
I. COMBINING SECM WITH OTHER TECHNIQUES Carrying out SECM experiments in concert with other techniques, such as atomic force microscopy (AFM) or near-field scanning optical microscopy (NSOM), greatly increases the difficulty of the experiment and presents challenging problems in tip fabrication. However, obtaining information from two different techniques at the same time and at exactly the same location can greatly increase the power of the SECM technique, e.g., by providing independent topographical or optical data during the SECM scan. Initial experiments have been reported along these lines, and these should continue in the coming years.
