ABSTRACT
TherecentproliferationofAtomicForceMicroscopes(AFMs)hasresultedintheir widespreadusefortheinvestigationofsurfaces.Themostsatisfactorymethodofusingthese instrumentstostudysoftsurfaces,suchaspolymers,isintheso-calledtappingmodeinwhich thesensingcantilever,whilevibratingatitsresonantfrequency,ismadetotapthesurface underinvestigation.Apictureisbuiltupbymonitoringeithertheamplitudeorphaseofthe cantilevervibrationsasitrastersoverthesurface.Imagesallegedlyshowingthesurface topography,surfacechargedistributionorthesurfacepotentialdistributioncanbeobtainedin thisway.Wenowreportwhycautionshouldbeexercisedininterpretingthesepicturesintoo simplisticafashion;theymaygiveadistortedrepresentationofthefeaturetheyarenominally illustratingortheymayevenbeillustratingacombinationoffeatures.
