ABSTRACT
TheprofilethicknessgagethatwasdevelopedbyIsotopeMeasuringSystems(IMS),USA[3]is showninFig.26.3.Inthisprofilemeter,twoCesium137radioactivesourcesaremountedinthetopyoke ofaC-frameandirradiateatotalof54ionchambersthataremountedintwoparallelrowsacrossthe stripwidth.Theoverlappingmulti-channelsimultaneousmeasurementoftheentirestripwidthensures accurateprofilemeasurementregardlessofthestripshapeororientation.Tomeasurethestripthickness at10mm(0.394in.)widthintervals,theC-frameoscillatesatrightanglestotherollingdirectionsuchthat eachchannelcoversatotalstripwidthof80mm(3.150in.)persecond(Fig.26.4).Duringatwosecond oscillationperiod,thestripthicknessismeasuredtwiceper10mm(0.394in.)intervalacrossthestrip.
