ABSTRACT
In Chapters 4 through 6, the rigorous coupled wave analysis (RCWA) method and the spectral domain techniques were used extensively to treat the solution of Maxwell’s equations for planar dielectric systems that were isotropic, anisotropic, and bianisotropic. Chapter 4 concentrated on the case when the dielectric layers were transversely homogeneous and the source and the EM želds of the system could be effectively represented as a Fourier k-space integral (i.e., waveguide slot, dipole antenna, etc.). Chapter 5 concentrated on the case when the dielectric layers were periodic diffraction gratings and the source of the system was Rayleigh plane waves. In Chapter 6, the RCWA method was used to study diffraction from photorefractive gratings.
