ABSTRACT
A.10.2 Applications of EBSD in Aluminum Research . . . . . . . . . . . . . . . . . . . . . . . . . 565 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 569
Electron backscatter diffraction (EBSD) is one of various scanning electron microscope (SEM) based techniques used to obtain local information on the crystallographic character of bulk crystalline or polycrystalline material. Because of the high spatial resolution, acceptable angular resolution, ease of adaptation to virtually any electron beam instrument, and automated data collection and mapping capability developed over the past decade, EBSD has become an important characterization tool in metallurgical, materials, and geophysical laboratories throughout the world. The technique was originally discussed by Alam, Blackman and Pashley in 1954 [1] and later investigated by Venables and co-workers [2,3]. The early literature dubbed the technique wide-angle Kikuchi diffraction and it has been referred to by several additional acronyms in the past decade. Those that are most notable, other than EBSD, include backscatter Kikuchi diffraction (BKD) and backscatter electron Kikuchi diffraction (BEKD). (Note: Acronyms of EBSP, BKP, and BEKP are also common in literature and these refer specifically to the image formed by the diffraction technique, i.e., electron backscatter diffraction pattern.) Appendix 10.1 contains references to significant papers that mark the development of EBSD and automated EBSD analysis.
