ABSTRACT
Dependability is essential for microfluidic biochips that are used for safetycritical applications. Therefore, these devices must be adequately tested after manufacture and during bioassay operations. In this chapter, we present a parallel scan-like testing methodology for digital microfluidic devices [65]. A diagnosis method based on test outcomes is also described. The diagnosis technique is enhanced such that multiple defect sites can be efficiently located using parallel scan-like testing. Defect diagnosis can be used to reconfigure a digital microfluidic biochip such that faults can be avoided, thereby enhancing chip yield and defect tolerance.
