ABSTRACT
The aim of this chapter is to provide the reader with an insight into methods for increasing sensitivity and dynamic range in the analysis of complex samples by utilizing data-directed mass spectrometry in conjunction with selective ion accumulation techniques. Three specic areas are considered: (i) the external accumulation of ions for detection by Fourier transform ion cyclotron resonance (FT-ICR) mass spectrometry (Section 7.2); (ii) the use of ion trapping prior to time-of-ight (TOF) mass analysis, including the use of the ion funnel trap (IFT), (Section 7.3); and (iii) the combination of ion mobility spectrometry (IMS) with TOF mass spectrometry (Section 7.4). From the range of applications discussed, it is evident that these different approaches are making signicant strides toward the goal of achieving higher analysis throughput, accompanied by improved sensitivity and mass accuracy.
