ABSTRACT
Extremely fine probes have already been developed which can be used to map out extremely detailed surface features. A three-dimensional representation of a region can be made by systematically sweeping the probe (scanning) across the sample. Here, "scanning" refers to a physical movement, and not the time-dependent change in potential or current as has been used for electrochemical scans referred to in the previous chapters. Scanning tunneling microscopy, for example, uses the electron tunneling current through a fine probe to obtain measurements at the atomic level.
