ABSTRACT

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for

chapter |4 pages

Defect structure of lead pyroniobates

chapter |4 pages

Developments in Cs-corrected STEM

chapter |4 pages

Extreme FESEM

chapter |4 pages

Is atomic resolution EELS possible?

chapter |4 pages

A microscopy station for Mars

chapter |4 pages

Image simulations of quantum dots