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High spatial resolution interface chemistry investigations on spin tunnel junctions with oxygen ion sputtered barriers

TEM samples were prepared using standard cross section preparation methods. Samples were epoxy glued face-to-face and ground and polished on both sides and stuck to a copper grid. They then were ion-beam milled using a Gatan PIPS system. Microscopy was carried out in a JEOL JEM-3000F microscope fitted with a Gatan 2K GIF spectrometer.