chapter
4 Pages

High spatial resolution interface chemistry investigations on spin tunnel junctions with oxygen ion sputtered barriers

TEM samples were prepared using standard cross section preparation methods. Samples were epoxy glued face-to-face and ground and polished on both sides and stuck to a copper grid. They then were ion-beam milled using a Gatan PIPS system. Microscopy was carried out in a JEOL JEM-3000F microscope fitted with a Gatan 2K GIF spectrometer.