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Towards scanned neutral particle microscopy: developing neutral particle analogues of charged particle lenses

Fig 1: A) Contour plot of analytic electrostatic field magnitude around a circular aperture in an infinitely thin conductive sheet separating an asymptotically uniform applied field (below aperture) from an asymptotically zero field (above aperture). B) Contour plot of self-consistent numerical calculation of magnetic field around a circular aperture in sheet of high permeability magnetizable material placed in an applied solenoid magnetic field. Magnetic shielding material has finite thickness to avoid magnetic saturation effects.