ABSTRACT
We have described in earlier chapters the basic techniques of scanning and transmission microscopy and diffraction. There are now many other techniques available for characterizing materials, each of which has some special advantage. In this final chapter an attempt is made to outline some of the most important techniques which can be used to complement electron micro scopy and to point out the areas of overlap between the techniques. We also try to indicate how electron microscopy is developing, often in response to devel opments in other areas. Most modern investigations, particularly in the materials sciences, exploit more than one technique and it is important to know what each can offer, even if one cannot be expert in all of them.
