ABSTRACT
M ail Stop K 320, 202 B urlington R oad, Bedford, MA 01730. E-mail: jldrury@mitre.org.Jean Scholtz, NIST, 100 Bureau Drive, MS 8940, Gaithersburg, MD 20899. E-mail: jean.scholtz@nist.gov.H C I Editorial Record. First manuscript received December 9,2002. Revision re-ceivedjuly 7, 2003. Accepted by Sara Kiesler and Pamela Hinds. Final manuscript received September 15, 2003. — Editor
