ABSTRACT
A spin-off to the spatial speci city of microtexture measurements is that planar surfaces or facets can be analyzed in some crystallographic detail. These surfaces include grain boundaries, phase boundaries, slip traces, cracks, and external surfaces of the specimen, such as facets or fracture surfaces. Although grain/phase boundaries and slip traces can be analyzed in TEM, there are considerable disadvantages, mainly in terms of statistical reliability. Furthermore, analysis of cracks or external specimen surfaces is not possible in TEM because of specimen preparation restrictions. However, SEM is ideal for studying the morphology of surfaces and so it is mainly EBSD that has been adapted to crystallographic studies of surfaces.
