ABSTRACT
In this chapter we introduce methods for texture determination that do not t into the earlier sections on x-ray or neutron macrotexture or electron microscope-based microtexture techniques.
Although x-ray diffraction is usually associated with macrotexture (Section 4.3), such methods can in principle also be used for individual-grain (microtexture) measurements if it can be arranged that the necessary small volumes in a sample are irradiated with a suf ciently ne x-ray beam. X-rays generated in a synchrotron offer this possibility since they are characterized by an intensity several orders of magnitude higher than those generated by conventional x-ray tubes, combined with a high brilliance, that is, low angular divergence. Accordingly, Laue patterns from individual grains or Debye-Scherrer patterns from small polycrystalline volumes can be obtained (Section 12.2). Although the underlying methods, Laue and Debye-Scherrer, have been known for decades (Section 3.4), the application of synchrotron radiation in texture research is a quite new, rapidly emerging eld.
