ABSTRACT
One-dimensional (1-D) optical modeling provides a powerful tool for analyzing optical aspects of thin-film photovoltaic devices. However, if different materials are introduced in the lateral direction, such as in device lateral structuring or surface texturing, certain assumptions and approximations have to be considered with respect to light scattering (scalar scattering theory) and antireflection. Another limitation of 1-D approaches is that the structure and applied illumination are assumed to be infinite in lateral directions; thus, effects at the edges of the device are not included in the analysis. If we want to consider variations in both lateral and vertical geometry of the structure, then two-(2-D) and three-dimensional (3-D) optical modeling become important.
