ABSTRACT
Modern chips are composed of tens or hundreds of millions and even billions of transistors. Hence, chip level reliability prediction methods are mostly statistical allowing a constant-rate assumption to be applied. Chip level reliability prediction tools, today, model the failure probability of the chips at the end of life, when the known wear-out mechanisms are expected to dominate. However, modern reliability tools do not predict the random, post burn-in, constant failure rate that would be seen in the field. All the current physics of failure solutions try to determine an average effect that can be represented by a single relation that gives an average value for the Mean Time Between Failures (MTBF), however this single relation can never reflect the true physics of multiple mechanisms.
