Optimal design on Accelerated Degradation Testing with Gamma process for reliability demonstration

This paper proposes a reliability demonstration method by ADT for products with Gamma process. The rest of this paper is organized as follows. Section 2 gives a motivating example. Section 3 delivers the models for the problem. Section 4 suggests a reliability demonstration method by judging the cumulative degradation in ADT. Section 5 presents an optimal ADT plan for efficient reliability demonstration. Section 6 offers the results that apply the proposed method to the motivating example. Section 7 concludes the paper.