Study of two reliability assessment models based on degradation data

The degradation path method given by Meeker (2001) is a simple and convenient approach which was widely used in early times. Meeker (2012) adopted this model to analyze the accelerated data of a sample of integrated-circuit devices. However, sometimes the degradation path model cannot guarantee the accuracy because it establishes the path only by analyzing the degradation statistical features, while ignoring product degradation mechanism.