ABSTRACT
This chapter discusses some of the techniques recommended in ISO 26262 and International Electrotechnical Commission 61508 for use during integration testing. It deals with the deliberate introduction of faults into a system. Fault injection also provides a level of confidence in the quality of the integration testing. If faults are injected and these are not found by the testing, it may be that the tests are inadequate. Most embedded systems have a common structure. The processing element reads input from one or more sensors, which may themselves be intelligent, performs some form of computation, and activates some output transducers. Model-based testing was used primarily during system test, but was also applied during module, integration, and acceptance testing. There is one significant problem associated with the automatic generation of test cases: that of the so-called “test oracle.” Integration testing produces a vast amount of data, particularly if traces of events are gathered during the testing.
