ABSTRACT

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.

section Section 2|60 pages

New instrumentation and election optics

section Section 3|34 pages

High resolution electron microscopy

section Section 5|46 pages

Quantitative electron scattering

section Section 6|26 pages

Advanced scanning probe techniques

section Section 7|48 pages

Advanced scanning electron microscopy and surface science

section Section 8|110 pages

Microannalysis and EELS

chapter |4 pages

Optimising ALCHEMI experiments

section Section 9|28 pages

Catalysts

section Section 10|50 pages

Semiconductros and superconductors

section Section 11|78 pages

Ceramics and interfaces

section Section 12|46 pages

Intermetallics

section Section 13|92 pages

General materials analysis

chapter |4 pages

Anisotropy in EELS of TiS2