ABSTRACT

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial

chapter |4 pages

Remote microscopy using the grid

chapter |6 pages

Strategies for one angstrom resolution

chapter |6 pages

Perspectives in nanoanalysis

chapter |4 pages

EELS ALCHEMI Revisited

chapter |4 pages

ELNES modelling of interfaces in steels