ABSTRACT
I. Introduction 252
A. Film Balance and Video Enhanced Fluorescence
Microscopy at the Air/Water Interface 252
II. Topological Analysis of Domains Structures 255
III. Chemical Analysis Surfactant Composition Using Imaging
Time-of-Flight Secondary Ion Mass Spectrometry 258
A. TOF-SIMS and Laser-SNMS 258
B. The Principles of TOF-SIMS and Laser-SNMS
Technique 259
The Technique 259
The Instrumentation 261
Sample Preparation 261
Mass Spectra 261
Imaging 262
Specific Features 262
C. TOF-SIMS and SNMS-Investigations of DPPC/DPPG/ SP-C-Films 263
Aim of the Investigation 263
Current affiliation: Lehrstuhl fu¨r Biophysik, Ruhr Universita¨t Bochum, Universita¨- tsstrasse, Bochum, Germany.
