ABSTRACT
To achieve the goal of further enhancing the efficiency and durability of SOCs, advanced characterization and measuring techniques are necessary for the development of materials. In Chapter 9, some commonly used methods for electrochemical measurement such as the current-voltage curve and electrochemical impedance spectroscopy are introduced. Some advanced characterization techniques for the microstructure and surface analysis of electrolyte and electrode materials used in SOCs, such as scanning transmission electron microscope (STEM), focused ion beam-scanning electron microscope (FIB-SEM), X-ray computed tomography (XCT), and secondary ion mass spectroscopy (SIMS), are classified and summarized. Typical simulation and calculation methods, including density functional theory (DFT) and molecular dynamics (MD), used for studying the reaction mechanisms on the atomic scale are also described.
