ABSTRACT
This chapter presents direct and indirect detection methods using semiconductor and scintillate materials to provide a background on x-ray detection materials used in medical imaging applications. It covers a summary of modeling approaches using Monte Carlo (MC) methods. The chapter describes the theory and implementation of a detailed MC model for direct x-ray detectors. It also presents the practical applications of the model and simulation results. Semiconductor x-ray detectors are important components of x-ray medical imaging systems and can be used in a wide range of modalities and applications. MC methods can be used for modeling solid-state x-ray detectors and provide insight into the fundamental physics and theoretical performance limitations of imaging detectors. In the application section, simulation results are shown for a-Se detectors in the conventional geometry and Si detectors in edge on geometry operating in photon-counting mode. Detector thickness and carrier mobility can greatly affect the transport properties and hence the detector performance.
