ABSTRACT
In most literatures, the degradation rates at different stress levels have been modeled by Arrhenius function which may not be suitable for solid-state lasers’ accelerated degradation test, for the reason that the accelerated stress chosen in this study is input electrical power, which determines the inverse power law model is preferred. Moreover, different from most products, the failure criteria of solid-state lasers is usually decided by its optical output power, which is related to two factors: the actual degradation variable (photoelectric change efficiency) and accelerate stress level (input electrical power). That means, the failure criteria in this test is not decided by degradation variables but the joint effect of both degradation variables and accelerated stress levels. Therefore, when conducting a SSADT for a solid-state laser product, the optical output power will show sudden bounce when input electrical power switches to a higher level and continue degrading at a faster speed, as shown in Figure 1.
