ABSTRACT
The properties of electrodeposits and mechanistic aspects of growth can best be understood if the films are characterized while they are growing or after the electrodeposition process has ended. As such, characterization techniques can be classified as (1) in situ techniques (used as the films grow) and (2) ex situ techniques (used after final film growth). The use of these techniques for the characterization of semiconducting films is still scanty although they have often been used for metal electrodeposits. In this chapter, an attempt is made to present some techniques that have already been used or can in principle be used for the characterization of electrodeposits.
