ABSTRACT
To predict the impact of natural radiation on the behavior of electronics and to (statistically) estimate (measure) its radiation-induced soft-error rate (SER), three different experimental methods can be envisaged (Ziegler and Puchner 2004; JEDEC 2006), excluding modeling and simulation approaches, which can be used, under certain conditions (i.e., when correctly calibrated), as predictive tools (see Chapter 10).
