ABSTRACT
Each fabricated low-power circuit needs to be tested for manufacturing defects by applying test stimuli to the circuit, obtaining its responses, and comparing them with expected responses to determine whether the circuit is defective. This chapter aims to provide readers with basic information about large-scale integration (LSI) testing and to familiarize them with state-of-the-art low-power testing solutions. It describes the key components that are included in a typical power management circuitry and their functions. The chapter provides a brief overview on how to generate tests for some components, including in the power manager circuitry. It describes that the inductive noise is triggered by abrupt change of circuit switching activity such that the power grid cannot deliver the power quickly enough to the cells with transition. The chapter explores several techniques to reduce the impact of the inductive noise on scan-based testing.
