ABSTRACT
This conclusion presents some closing thoughts on the concepts discussed in the preceding chapters of this book. The book presents detailed analyses of various test methods used in the industry as well as proposed by academia for testing of small-delay defects (SDDs). It also presents basics about various fault models, test methods, and design-for-test techniques. The book discusses timing-aware pattern generation techniques for testing of SDDs. It describes test methods based on a faster-than-at-speed approach. The book also describes the alternative or hybrid test methods that resolve the issue of the large pattern count and run time without compromising the test quality. It presents a detailed analysis of different test quality metrics used to measure the small-delay defect effectiveness for a given pattern set. In terms of the future, as the technology moves beyond 20 nm and special circuit structures like FinFet are used, a clear and through understanding of small-delay defects may be required.
