ABSTRACT
Since cosmic rays and on-chip radioactive impurities have been identied to be at the origin of soft errors in modern integrated circuits, the estimation of the soft error rate (SER) is rapidly becoming a major consideration for reliability aspects at device, circuit, and system levels-not only to investigate and understand technology sensitivity but also to extrapolate the trends for future generations of circuits [1]. Different experimental and simulation approaches are known to estimate SER: accelerated
9.1 Introduction ..................................................................................................225 9.2 Test Platforms and Environments ................................................................. 227
9.2.1 The ASTEP Platform ........................................................................ 227 9.2.2 The LSM Laboratory ........................................................................230
