ABSTRACT
This chapter focuses on automatic test pattern generation (ATPG). It introduces gate-level fault models and concepts in traditional combinational ATPG. The chapter discusses ATPG on gate-level sequential circuits. It describes circuit-based Boolean satistifiability techniques for solving circuit-oriented problems. The chapter illustrates ATPG for faults such as crosstalk and power supply noise, which involve timing and applications other than manufacturing testing. It presents sequential ATPG approaches that go beyond the traditional gate-level model. As design trends move toward nanometer technology, new ATPG problems are emerging. The efficiency of an ATPG implementation depends primarily on the decision ordering it takes. Practical implementation of an ATPG tool often involves a mixture of learning heuristics and search strategies. Popular commerical ATPG tools support full-scan designs where ATPG is mostly combinational. Sequential-circuit ATPG searches for a sequence of vectors to detect a particular fault through the space of all possible vector sequences.
