ABSTRACT
Investigations of typical touch trigger probe indicate that probe errors can be generated from different sources. This chapter discusses coordinate measuring machine (CMM) and stylus root errors in detail using a novel experimental analysis technique based on signal separation using mainly the Fourier analysis. The measurement strategy of the study parameters is tabulated based on two different working groups of styli I and II using a standard artifact gauge ring. In the chapter, experiment-based Fourier analysis using separate undulations per revolution (UPR) as a spatial frequency response through scanning operation in artifact measurements is done in standard conditions. The chapter analyses empirical equations of root error responses for the stylus system and the machine. It also determines the prediction root errors of both the stylus system and the CMM at the micro-scale response. This work is also very important for correction techniques of CMM development and improves the skills of CMM operator.
