ABSTRACT
Most applications of X-ray diffraction are associated with the measurement of the diffraction angle. The Bragg law well describes the necessary condition for diffraction in a very simple manner, Laue equations is described as well. X-ray diffraction is a consequence of the constructive interference between waves scattered from successive lattice planes. The peak broadening caused by small crystal dimensions can also be related to the diffraction condition in reciprocal space. This reciprocal approach is very useful for explaining thin film X-ray diffraction and transmission electron microscopy. If a feature’s dimension along a certain direction in real apace is small, the feature size along that direction in reciprocal space is large.
