ABSTRACT
The times to failure in hours for 24 transistors [1] are listed in Table 32.1. It is well established that the failures of solid-state semiconductor components (e.g., transistors) conform to lognormal statistics (Section 7.17.3). The two-parameter Weibull model was suggested for the analysis [1]. 24 Transistor Failure Times (h)
260
350
420
440
480
480
530
580
680
710
740
780
820
840
920
930
1050
1060
1070
1270
1340
1370
1880
2130
