ABSTRACT
Textured ZnS thin films were deposited onto both amorphous glass substrates and Si (100) substrates using a cost-effective electrostatic spray assisted vapour deposition (ESAVD) method. The {111} texture nature of ZnS films on glass was revealed using X-ray diffraction. No preferred in-plane orientation was found in the ZnS films, but both low and high angle grain boundaries were observed by phase contrast lattice imaging. Different from ZnS films on glass substrates, 100 texture was developed in ZnS films on Si (100) substrates, which was confirmed by both x-ray diffraction and transmission electron microscopy.
