ABSTRACT
Accelerated life-test results of optocouplers from three manufacturers are described in this paper. The experiment consists in aging optocouplers Light Emitting Diode with high forward current.
Current Transfert Ratio (CTR) is the electrical parameter that presents the most significant evolution. Several assumptions can be proposed to explain its degradation.
All results show that, for one optocoupler type (4N25) behaviour during aging is very different according to the origin of the component.
