ABSTRACT
A comparitive study, using a rigorous numerical model, has been undertaken between an unetched waveguide and an etched Ti:LiNbO3 ridge waveguide Mach-Zehnder inteferometric (MZI) modulator in order to show the benefits of using edged ridge waveguides for the MZI modulator. It has also been shown that etched ridge waveguides led to smaller more compact bends for the input and output (IO) waveguides to the MZI modulator without incurring as high loss as the unetched waveguide modulator. This study was then developed to show that the modulator could be improved further by changing the fabrication parameters.
