ABSTRACT
Electronic products that underwent highly accelerated life testing (HALT), passed the existing qualification tests (QTs) and survived burn-in testing (BIT) often exhibit nonetheless premature field failures. Shortening of electronic product's design and development time does not allow in today's industrial environment for time-consuming reliability investigations. A typical example of product development testing (PDT) is shear-off testing conducted when there is a need to determine the most feasible bonding material and its thickness, and/or to assess its strength and/or evaluate the shear modulus of this material. Predictive modeling has proven to be a highly useful means for understanding the physics of failure and designing the most practical accelerated tests in electronic and photonic engineering. Design for reliability (DfR) is a set of approaches, methods, and best practices that are supposed to be used at the design stage of an electronic or a photonic product to minimize the risk that the product might not meet the reliability objectives and customer expectations.
