ABSTRACT
Chapter 1, titled “VLSI Testing—An Introduction,” introduces the topic of VLSI testing. The discussion includes the importance of testing in the VLSI design cycle, fault models, test generation techniques, and design-for-testability (DFT) strategies. This is followed by the sources of power dissipation during testing and its effects on the chip being tested. The problem of thermal-aware testing has been enumerated, clearly bringing out the limitations of power-constrained test strategies in reducing peak temperature and its variance. The thermal model used in estimating temperature values is elaborated.
