ABSTRACT
Chapter 3 is titled “Test Data Compression.” To reduce the transfer time of test pattern, test data are often stored in the tester in a compressed format, which is decompressed at the chip-level before application. As both data compression and temperature minimization strategies effectively exploit the don't care bits of test patterns, there exists a trade-off between the degree of compression and the attained reduction in temperature. This chapter presents techniques for dictionary-based compression, discussed the temperature-compression trade-off, and outlines temperature reduction techniques that don't sacrificing compression.
