ABSTRACT
This chapter describes the semiconductor integrated passive components, specifically resistors and capacitors, with respect to their fundamental operating principles, intrinsic parameters and, importantly, layout considerations to optimize device performance. In microelectronic circuits, especially in applications used for computing data at high rates, such as operations performed by microprocessors and microcomputers, increasing the number of on-chip transistors characteristically relates to higher computing speed, additional memory and more efficient data transfer. Therefore, to realize miniaturization, as proposed by Moore's law, efficient layout, circuit enhancements and design methodologies should not only be applied to active components such as the transistor. Test structures are often included in IC design on strategically relevant on the wafer to measure characteristics such as sheet resistance, contact resistance, actual feature dimensions, and uniformity across the wafer and overlay errors. In integrated resistors, low-frequency noise has become crucial to factor in as device scaling advances, driven by Moore's law.
