ABSTRACT
Time domain reflectometry is used to characterize interconnections in the time domain. The setup essentially consists of a time domain step generator and a digital sampling oscilloscope (Fig. 43.1) [1]. The generator produces a positive-going step signal with a well-defined rise time. The step is applied to the device under test. The reflected and the transmitted signals are shown on the oscilloscope. Measuring the reflected signal is called time domain reflectometry (TDR); the transmitted signal is measured using the time domain transmission (TDT) option.
