ABSTRACT
This chapter presents new methods and microchips for the measurement of electrical and thermal conductivity and Seebeck coefficient on individual nanowires, which were electrochemically deposited by ion-track technology and on nanostructures that have been realized by focused electron/ion beam-induced deposition (FEBID/FIBID). FEBID/FIBID is a direct beam writing technique for the realization of nano- and microstructures. To perform thermoelectric measurements on nanowires and FEBID nanostructures, their integration in specific microchips is required. Long-term stability is a crucial parameter of thin-film contacts on nanostructures, especially for their applications at elevated temperatures. Long-term stability is a crucial parameter of thin-film contacts on nanostructures, especially for their applications at elevated temperatures. Sophisticated microdevices have been designed and applied for the measurement of thermal conductivity of nanostructures. Measurements of electrical conductivity s are performed using a four-point-probe technique, where the four thin-film Ti/Au lines of two neighboring cantilevers are applied as current and potential probes.
