ABSTRACT

This chapter provides a brief overview of the generation of compact model library for circuit simulation and compact model usage in circuit computer-aided design. The task in generating a model library is the data collection from the devices of the target technology representing the entire design space under the operating biasing conditions and ambient temperatures. Data collection includes the selection of an acceptable set of devices representing the entire integrated circuit (IC) design space and selection of device characteristics that account for the real-device effects to extract device model parameters to modeling physical, geometrical, and ambient temperature effects on the device performance in IC chips. The data acquisition and data fitting to generate the model parameters and parameterization of the process variability-sensitive model parameters are critical for statistical compact model.