ABSTRACT
In order to investigate fundamental excitation characteristics of SFQWs photoluminescence (PL) and photoreflectance (PR) measurement were performed at low temperatures. A preliminary result on well width variation of exciton oscillator strength was obtained from PL and PR spectra, indicating that an SFQW having a well width of 150 nm shows an oscillator strength 2.4 times larger than that of a surface QW having a well width of 30 nm.
