ABSTRACT
Second generation X-ray lasers Ph. Zeitoun, G. Faivre, S. Sebban, T. Mocek, S. Hallou, Ph. Bakou, F. Burgy, D. Douillet, T. Lefrou, P. Mercèrelí, A. S. Morlens, J. P. Rousseau, and C. Valentin Laboratoire d'Optique Appliquée, chemin de la hunière, 91128 Palaiseau, France Imagine Optic, 18, rue Charles de Gaulle 91400, Orsay, France
M. Fajardo GoLP, Instituto Superior Technico, Lisbon, Portugal
S. Kazamias Laboratoire d'Interaction du Rayonnement X avec la Matière, bât. 350,
Université Paris-Sud, 91405 Orsay, France
D. Aubert, G. de Lachèze-Murel CEA/ DIF, BP 12, 91680 BRUYERES-LE-CHATEL, France
S. le Pape Laboratoire pour l'Utilisation des Lasers Intenses, Ecole Polytechnique, 91128 Palaiseau, FRANCE
Abstract.We studied seeding of two x-ray lasers at 32.8 nm (Kr^+) and 41.6 nm (Xe°+). We succeeded to increase from a factor 10 to 200 the harmonics energy, without decreasing their optical qualities. The resulting beam was polarized, coherent and we estimate its duration to 500 fs. This structure seems to be the beginning of a new generation of X-ray laser (XRL), with considerable improvements compare to the actual XRL. Furthermore this technique can help for the measurement of many plasma parameters.
